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Jacob Savir, Distinguished Professor and an IEEE Fellow, has made significant contributions to the field of Design and Test of Digital Systems. His research contributions are recognized internationally, and his work is taught in many institutions around the world. Dr. Savir’s research accomplishments in test technology have been culminated in the text “Built-In Test for VLSI: Pseudorandom Techniques”, John Wiley, 1987, and he is a recipient of multiple publication awards in this field.
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