Date: May 18, 2009 (Monday)
Time: 11:30am
Place: ECE 202

About the Presenter:

Ramesh Karri received his Ph.D. degree in Computer Science from University of California at San Diego. He was an Assistant Professor in the Department of Electrical and Computer Engineering in University of Massachusetts, Amherst, MA, and a Member of Technical Staff, Lucent Bell Labs Engineering Research Center, Princeton, NJ. During this time, he initiated the research and development effort in on‐line built-in self test of VLSICs; built a VHDL Library for on-line concurrent fault detection circuits; and developed techniques for testing embedded intellectual property cores. Currently, he is an Associate Professor at the Department of Electrical and Computer Engineering, Polytechnic Institute of NYU, Brooklyn, NY. His research interest are Computer Aided Design of fault-tolerant VLSI systems, Computer Aided VLSI synthesis targeting deep sub‐micron reliability/low power, High-speed Architectures for network protocols and encryption. He is the recipient of the Alexander Von Humboldt Fellowship; Institut for Informatik, University of Potsdam, Germany, 2002, among other awards.

About the Talk:

An EETimes article in 2004 highlighted the vulnerabilities introduced by VLSI Test circuitry. In this talk, I will show that any chip that uses scan design for test is vulnerable to attacks on the chip. I will use the Data Encryption Standard (DES) and Advanced Encryption Standard (AES) as case studies to show that these mathematically strong crypto primitives can be compromised when implemented on a chip. I will then discuss solutions to protect against this class of attacks.

Note:

If you wish to meet Dr. Karri for technical discussions before his presentation, please send email to Roberto Rojas‐Cessa (rojas@njit.edu).

Sponsors:

NJIT Department of Electrical and Computer Engineering

For more information contact Roberto Rojas‐Cessa (rojas@njit.edu).

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Note: All ECE MS thesis defense and Ph.D. dissertation (proposal) defense are counted towards ECE791.